Improved high-resolution seismic profiling.

Massachusetts Institute of Technology. Dept. of Geology and Geophysics. Thesis. 1966. M.S. === Bibliography: leaf 43. === M.S.

Bibliographic Details
Main Author: Krotser, Donald Jay
Other Authors: Lee Wallace Dean, III.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2010
Subjects:
Online Access:http://hdl.handle.net/1721.1/59609
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spelling ndltd-MIT-oai-dspace.mit.edu-1721.1-596092019-05-02T15:51:01Z Improved high-resolution seismic profiling. Krotser, Donald Jay Lee Wallace Dean, III. Massachusetts Institute of Technology. Dept. of Geology and Geophysics Geology and Geophysics Massachusetts Institute of Technology. Dept. of Geology and Geophysics. Thesis. 1966. M.S. Bibliography: leaf 43. M.S. 2010-10-29T17:51:19Z 2010-10-29T17:51:19Z 1966 Thesis http://hdl.handle.net/1721.1/59609 26060247 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 51 leaves application/pdf Massachusetts Institute of Technology
collection NDLTD
language English
format Others
sources NDLTD
topic Geology and Geophysics
spellingShingle Geology and Geophysics
Krotser, Donald Jay
Improved high-resolution seismic profiling.
description Massachusetts Institute of Technology. Dept. of Geology and Geophysics. Thesis. 1966. M.S. === Bibliography: leaf 43. === M.S.
author2 Lee Wallace Dean, III.
author_facet Lee Wallace Dean, III.
Krotser, Donald Jay
author Krotser, Donald Jay
author_sort Krotser, Donald Jay
title Improved high-resolution seismic profiling.
title_short Improved high-resolution seismic profiling.
title_full Improved high-resolution seismic profiling.
title_fullStr Improved high-resolution seismic profiling.
title_full_unstemmed Improved high-resolution seismic profiling.
title_sort improved high-resolution seismic profiling.
publisher Massachusetts Institute of Technology
publishDate 2010
url http://hdl.handle.net/1721.1/59609
work_keys_str_mv AT krotserdonaldjay improvedhighresolutionseismicprofiling
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