Optical characterization of thermal transport from the nanoscale to the macroscale

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2008. === Includes bibliographical references (p. 171-181). === The thermal properties of thin films and material interfaces play an important role in many technologies such as microelectronics and solid-state e...

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Bibliographic Details
Main Author: Schmidt, Aaron Jerome, 1979-
Other Authors: Gang Chen.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2009
Subjects:
Online Access:http://hdl.handle.net/1721.1/44798

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