Peak-load transmission pricing for the IEEE reliability test system

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997. === Includes bibliographical references (leaves 111-112). === by Edo Macan. === M.Eng.

Bibliographic Details
Main Author:	Macan, Edo
Other Authors:	Marija Ilic.
Format:	Others
Language:	English
Published:	Massachusetts Institute of Technology 2008
Subjects:	Electrical Engineering and Computer Science
Online Access:	http://hdl.handle.net/1721.1/42713

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record_format	oai_dc
spelling	ndltd-MIT-oai-dspace.mit.edu-1721.1-427132019-05-02T15:57:00Z Peak-load transmission pricing for the IEEE reliability test system Macan, Edo Marija Ilic. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997. Includes bibliographical references (leaves 111-112). by Edo Macan. M.Eng. 2008-09-03T17:58:19Z 2008-09-03T17:58:19Z 1997 1997 Thesis http://hdl.handle.net/1721.1/42713 38131523 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 112 leaves application/pdf Massachusetts Institute of Technology
collection	NDLTD
language	English
format	Others
sources	NDLTD
topic	Electrical Engineering and Computer Science
spellingShingle	Electrical Engineering and Computer Science Macan, Edo Peak-load transmission pricing for the IEEE reliability test system
description	Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997. === Includes bibliographical references (leaves 111-112). === by Edo Macan. === M.Eng.
author2	Marija Ilic.
author_facet	Marija Ilic. Macan, Edo
author	Macan, Edo
author_sort	Macan, Edo
title	Peak-load transmission pricing for the IEEE reliability test system
title_short	Peak-load transmission pricing for the IEEE reliability test system
title_full	Peak-load transmission pricing for the IEEE reliability test system
title_fullStr	Peak-load transmission pricing for the IEEE reliability test system
title_full_unstemmed	Peak-load transmission pricing for the IEEE reliability test system
title_sort	peak-load transmission pricing for the ieee reliability test system
publisher	Massachusetts Institute of Technology
publishDate	2008
url	http://hdl.handle.net/1721.1/42713
work_keys_str_mv	AT macanedo peakloadtransmissionpricingfortheieeereliabilitytestsystem
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Peak-load transmission pricing for the IEEE reliability test system

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