Test and diagnosis of microprocessor memory arrays using functional patterns

Test and diagnosis of microprocessor memory arrays using functional patterns

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. === Includes bibliographical references (p. 101). === by Ya-Chieh Lai. === M.Eng.

Bibliographic Details
Main Author: Lai, Ya-Chieh
Other Authors: Srinivas Devadas.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2008
Subjects:
Electrical Engineering and Computer Science
Online Access:http://hdl.handle.net/1721.1/40173

Internet

http://hdl.handle.net/1721.1/40173

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