New methodologies for interconnect reliability assessments of integrated circuits
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2000. === Includes bibliographical references (leaves 245-251). === The stringent performance and reliability demands that will accompany the development of next-generation circuits and new metallizati...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2006
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| Online Access: | http://hdl.handle.net/1721.1/31092 |