New methodologies for interconnect reliability assessments of integrated circuits

New methodologies for interconnect reliability assessments of integrated circuits

Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2000. === Includes bibliographical references (leaves 245-251). === The stringent performance and reliability demands that will accompany the development of next-generation circuits and new metallizati...

Full description

Bibliographic Details
Main Author: Hau-Riege, Stefan P. (Stefan Peter), 1970-
Other Authors: Carl V. Thompson.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2006
Subjects:
Materials Science and Engineering.
Online Access:http://hdl.handle.net/1721.1/31092

Internet

http://hdl.handle.net/1721.1/31092

Similar Items