The application of Moire interferometry to automated 3-dimensional inspection

The application of Moire interferometry to automated 3-dimensional inspection

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1985. === MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING. === Includes bibliographical references. === by Joseph M. Wander. === M.S.

Bibliographic Details
Main Author: Wander, Joseph M
Other Authors: Steven Dubowsky.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2005
Subjects:
Mechanical Engineering.
Online Access:http://hdl.handle.net/1721.1/15264
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spelling ndltd-MIT-oai-dspace.mit.edu-1721.1-152642019-05-02T16:27:39Z The application of Moire interferometry to automated 3-dimensional inspection Wander, Joseph M Steven Dubowsky. Massachusetts Institute of Technology. Dept. of Mechanical Engineering. Massachusetts Institute of Technology. Dept. of Mechanical Engineering. Mechanical Engineering. Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1985. MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING. Includes bibliographical references. by Joseph M. Wander. M.S. 2005-08-05T20:47:43Z 2005-08-05T20:47:43Z 1985 1985 Thesis http://hdl.handle.net/1721.1/15264 13364297 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 258 [i.e. 262] leaves 14618654 bytes 14618408 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
collection NDLTD
language English
format Others
sources NDLTD
topic Mechanical Engineering.
spellingShingle Mechanical Engineering.
Wander, Joseph M
The application of Moire interferometry to automated 3-dimensional inspection
description Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1985. === MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING. === Includes bibliographical references. === by Joseph M. Wander. === M.S.
author2 Steven Dubowsky.
author_facet Steven Dubowsky.
Wander, Joseph M
author Wander, Joseph M
author_sort Wander, Joseph M
title The application of Moire interferometry to automated 3-dimensional inspection
title_short The application of Moire interferometry to automated 3-dimensional inspection
title_full The application of Moire interferometry to automated 3-dimensional inspection
title_fullStr The application of Moire interferometry to automated 3-dimensional inspection
title_full_unstemmed The application of Moire interferometry to automated 3-dimensional inspection
title_sort application of moire interferometry to automated 3-dimensional inspection
publisher Massachusetts Institute of Technology
publishDate 2005
url http://hdl.handle.net/1721.1/15264
work_keys_str_mv AT wanderjosephm theapplicationofmoireinterferometrytoautomated3dimensionalinspection
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