Thermal annealing effects on boron-implanted HgCdTe diodes

Thermal annealing effects on boron-implanted HgCdTe diodes

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. === Vita. === Bibliography: leaves 114-117. === by Jing-Kai Syz. === Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988.

Bibliographic Details
Main Author: Syz, Jing-Kai.
Other Authors: Robert H. Kingston.
Format: Others
Published: Massachusetts Institute of Technology 2021
Subjects:
Electrical Engineering and Computer Science.
Online Access:https://hdl.handle.net/1721.1/129636
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spelling ndltd-MIT-oai-dspace.mit.edu-1721.1-1296362021-02-04T05:10:30Z Thermal annealing effects on boron-implanted HgCdTe diodes Syz, Jing-Kai. Robert H. Kingston. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Electrical Engineering and Computer Science. Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. Vita. Bibliography: leaves 114-117. by Jing-Kai Syz. Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. 2021-02-02T18:54:34Z 2021-02-02T18:54:34Z 1988 1988 Thesis https://hdl.handle.net/1721.1/129636 18720614 MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided. http://dspace.mit.edu/handle/1721.1/7582 118 leaves application/pdf Massachusetts Institute of Technology
collection NDLTD
format Others
sources NDLTD
topic Electrical Engineering and Computer Science.
spellingShingle Electrical Engineering and Computer Science.
Syz, Jing-Kai.
Thermal annealing effects on boron-implanted HgCdTe diodes
description Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. === Vita. === Bibliography: leaves 114-117. === by Jing-Kai Syz. === Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988.
author2 Robert H. Kingston.
author_facet Robert H. Kingston.
Syz, Jing-Kai.
author Syz, Jing-Kai.
author_sort Syz, Jing-Kai.
title Thermal annealing effects on boron-implanted HgCdTe diodes
title_short Thermal annealing effects on boron-implanted HgCdTe diodes
title_full Thermal annealing effects on boron-implanted HgCdTe diodes
title_fullStr Thermal annealing effects on boron-implanted HgCdTe diodes
title_full_unstemmed Thermal annealing effects on boron-implanted HgCdTe diodes
title_sort thermal annealing effects on boron-implanted hgcdte diodes
publisher Massachusetts Institute of Technology
publishDate 2021
url https://hdl.handle.net/1721.1/129636
work_keys_str_mv AT syzjingkai thermalannealingeffectsonboronimplantedhgcdtediodes
_version_ 1719375385033965568

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