Impact of extended defects on ion diffusion and reactivity in binary oxides : assessed by atomistic simulations
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Nuclear Science and Engineering, 2019 === Cataloged from PDF version of thesis. === Includes bibliographical references (pages 195-238). === Extended defects, such as dislocations, grain boundaries and surface step edges, are ubiqu...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2019
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| Online Access: | https://hdl.handle.net/1721.1/121806 |