An AFM study of the surface of a polymer film bombarded by low energy gaseous ions
This research studies the radiation damage on polymeric materials caused by accelerated ions. Gaseous ions are accelerated to different energies between 10 keV and 50 keV at fluences up to 10$\sp{15}$ ions/cm$\sp2$ by 200 keV Whickham ion accelerator at room temperature. The 2 x 2 cm$\sp2$ polyimide...
Main Author: | He, Dixon D. |
---|---|
Language: | en_US |
Published: |
2007
|
Online Access: | http://hdl.handle.net/1993/892 |
Similar Items
-
An AFM study of the surface of a polymer film bombarded by low energy gaseous ions
by: He, Dixon D.
Published: (2007) -
An AFM study of the surface of a polymer film bombarded by low energy gaseous ions
by: He, Dixon D.
Published: (2007) -
The effect of low energy ion bombardment on the crystallographic orientation of thin films
by: Yu, Lock See
Published: (2005) -
Electrical analysis of low energy argon ion bombarded GaAs
by: Cole, Eric D.
Published: (2015) -
A field-ion microscope study of low energy ion bombardment of metals
by: Garrett, Ian
Published: (1969)