Investigation of defects in silicon by means of the positron annihilation technique

Investigation of defects in silicon by means of the positron annihilation technique

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Bibliographic Details
Main Author: Abdurahman, Khaled
Published: 2014
Online Access:http://hdl.handle.net/1993/29179
id ndltd-MANITOBA-oai-mspace.lib.umanitoba.ca-1993-29179
record_format oai_dc
spelling ndltd-MANITOBA-oai-mspace.lib.umanitoba.ca-1993-291792014-11-26T15:44:23Z Investigation of defects in silicon by means of the positron annihilation technique Abdurahman, Khaled 2014-11-24T22:09:59Z 2014-11-24T22:09:59Z 1992 http://hdl.handle.net/1993/29179
collection NDLTD
sources NDLTD
description
author Abdurahman, Khaled
spellingShingle Abdurahman, Khaled
Investigation of defects in silicon by means of the positron annihilation technique
author_facet Abdurahman, Khaled
author_sort Abdurahman, Khaled
title Investigation of defects in silicon by means of the positron annihilation technique
title_short Investigation of defects in silicon by means of the positron annihilation technique
title_full Investigation of defects in silicon by means of the positron annihilation technique
title_fullStr Investigation of defects in silicon by means of the positron annihilation technique
title_full_unstemmed Investigation of defects in silicon by means of the positron annihilation technique
title_sort investigation of defects in silicon by means of the positron annihilation technique
publishDate 2014
url http://hdl.handle.net/1993/29179
work_keys_str_mv AT abdurahmankhaled investigationofdefectsinsiliconbymeansofthepositronannihilationtechnique
_version_ 1716720504867389440

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