Characterization of NanoGUMBOS for Future Electronic Devices
In our work on hybrid (organic-inorganic) electronic materials (HEMs), we have developed a reasonably facile method for characterizing GUMBOS or a Group of Uniform Materials Based on Organic Salts. In addition to the versatility of traditional ionic liquids (i.e.-solubility, melting point, viscosity...
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ndltd-LSU-oai-etd.lsu.edu-etd-12192011-1722272013-01-07T22:53:46Z Characterization of NanoGUMBOS for Future Electronic Devices Narayan Jagadish, Naveen Electrical & Computer Engineering In our work on hybrid (organic-inorganic) electronic materials (HEMs), we have developed a reasonably facile method for characterizing GUMBOS or a Group of Uniform Materials Based on Organic Salts. In addition to the versatility of traditional ionic liquids (i.e.-solubility, melting point, viscosity), NanoGUMBOS are functionalizable to exhibit properties such as fluorescence, magnetic susceptibility, and even antimicrobial activity. However, given our interest in the electrical properties of HEMs, we have made first-time measurements of NanoGUMBOS, using conductive probe Atomic Force Microscopy (CP-AFM), in order to deduce their room temperature current-voltage characteristics. In conjunction with the nanoscale imaging of AFM alone, we have observed both the morphology and conductivity of these unique materials. Our results bode well for combining GUMBOS with substrates of more traditional materials, such as metals or semiconductors, to serve as the basis for future HEMs-based devices. We have also determined the optical characteristics of NanoGUMBOS using Raman Spectroscopy (RS). The Raman signatures can be used for detection of a nanoparticle and modeling the electron-phonon interaction inside the nanoparticle. Hah, Dooyoung Feldman, Martin Daniels-Race, Theda LSU 2012-01-04 text application/pdf http://etd.lsu.edu/docs/available/etd-12192011-172227/ http://etd.lsu.edu/docs/available/etd-12192011-172227/ en unrestricted I hereby certify that, if appropriate, I have obtained and attached herein a written permission statement from the owner(s) of each third party copyrighted matter to be included in my thesis, dissertation, or project report, allowing distribution as specified below. I certify that the version I submitted is the same as that approved by my advisory committee. I hereby grant to LSU or its agents the non-exclusive license to archive and make accessible, under the conditions specified below and in appropriate University policies, my thesis, dissertation, or project report in whole or in part in all forms of media, now or hereafter known. I retain all other ownership rights to the copyright of the thesis, dissertation or project report. I also retain the right to use in future works (such as articles or books) all or part of this thesis, dissertation, or project report. |
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Electrical & Computer Engineering Narayan Jagadish, Naveen Characterization of NanoGUMBOS for Future Electronic Devices |
description |
In our work on hybrid (organic-inorganic) electronic materials (HEMs), we have developed a reasonably facile method for characterizing GUMBOS or a Group of Uniform Materials Based on Organic Salts. In addition to the versatility of traditional ionic liquids (i.e.-solubility, melting point, viscosity), NanoGUMBOS are functionalizable to exhibit properties such as fluorescence, magnetic susceptibility, and even antimicrobial activity. However, given our interest in the electrical properties of HEMs, we have made first-time measurements of NanoGUMBOS, using conductive probe Atomic Force Microscopy (CP-AFM), in order to deduce their room temperature current-voltage characteristics. In conjunction with the nanoscale imaging of AFM alone, we have observed both the morphology and conductivity of these unique materials. Our results bode well for combining GUMBOS with substrates of more traditional materials, such as metals or semiconductors, to serve as the basis for future HEMs-based devices. We have also determined the optical characteristics of NanoGUMBOS using Raman Spectroscopy (RS). The Raman signatures can be used for detection of a nanoparticle and modeling the electron-phonon interaction inside the nanoparticle. |
author2 |
Hah, Dooyoung |
author_facet |
Hah, Dooyoung Narayan Jagadish, Naveen |
author |
Narayan Jagadish, Naveen |
author_sort |
Narayan Jagadish, Naveen |
title |
Characterization of NanoGUMBOS for Future Electronic Devices |
title_short |
Characterization of NanoGUMBOS for Future Electronic Devices |
title_full |
Characterization of NanoGUMBOS for Future Electronic Devices |
title_fullStr |
Characterization of NanoGUMBOS for Future Electronic Devices |
title_full_unstemmed |
Characterization of NanoGUMBOS for Future Electronic Devices |
title_sort |
characterization of nanogumbos for future electronic devices |
publisher |
LSU |
publishDate |
2012 |
url |
http://etd.lsu.edu/docs/available/etd-12192011-172227/ |
work_keys_str_mv |
AT narayanjagadishnaveen characterizationofnanogumbosforfutureelectronicdevices |
_version_ |
1716478317494796288 |