Quiescent Current Testing of CMOS Data Converters
Power supply quiescent current (IDDQ) testing has been very effective in VLSI circuits designed in CMOS processes detecting physical defects such as open and shorts and bridging defects. However, in sub-micron VLSI circuits, IDDQ is masked by the increased subthreshold (leakage) current of MOSFETs a...
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| Format: | Others |
| Language: | en |
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LSU
2008
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| Online Access: | http://etd.lsu.edu/docs/available/etd-11122008-143700/ |