IDDQ Testing of a CMOS First Order Sigma-Delta Modulator of an 8-Bit Oversampling ADC
This work presents IDDQ testing of a CMOS first order sigma-delta modulator of an 8-bit oversampling analog-to-digital converter using a built-in current sensor [BICS]. Gate-drain, source-drain, gate-source and gate-substrate bridging faults are injected using fault injection transistors. All the f...
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| Format: | Others |
| Language: | en |
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LSU
2004
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| Online Access: | http://etd.lsu.edu/docs/available/etd-05272004-162258/ |