The Development of an AC Magneto- Optic Kerr Effect System for the Characterization of Pulsed Laser Deposited Co¬¬2MnSixAl1-x Heusler Alloy Thin Films

The Kerr rotation and Kerr ellipticity of thin films can be measured using an AC magneto-optic Kerr effect (AC-MOKE) system. The longitudinal MOKE measurements were taken for a series of Co2MnSixAl1-x thin films with values of x= 0.00, 0.25, 0.50, 0.75, 1.00. The films were fabricated using ultra hi...

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Bibliographic Details
Main Author: Champagne, Matthew Stephen
Other Authors: Sheehy, Daniel
Format: Others
Language:en
Published: LSU 2013
Subjects:
Online Access:http://etd.lsu.edu/docs/available/etd-01222013-162013/