Electrochemical preconcentration and separation for elemental analysis using an inductively coupled plasma for atomic emission spectrometry with a direct sample insertion device
The application of controlled potential electrolysis for the elemental analysis by the inductively coupled plasma for atomic emission spectrometry using a direct sample insertion device will be described. The purpose of the technique is to improve the ICP detection limits over those obtained by conv...
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| Format: | Others |
| Language: | en |
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McGill University
1985
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| Online Access: | http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=72027 |