An efficient single-latch scan-design scheme/

Bibliographic Details
Main Author: Panda, Uma R.
Format: Others
Language:en
Published: McGill University 1985
Subjects:
Online Access:http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=63266
id ndltd-LACETR-oai-collectionscanada.gc.ca-QMM.63266
record_format oai_dc
spelling ndltd-LACETR-oai-collectionscanada.gc.ca-QMM.632662014-02-13T04:04:27ZAn efficient single-latch scan-design scheme/Panda, Uma R.Logic circuits -- Testing.Integrated circuits -- Very large scale integration -- Testing.McGill University1985Electronic Thesis or Dissertationapplication/pdfenalephsysno: 000221395proquestno: AAIML21668Theses scanned by UMI/ProQuest.All items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.Master of Engineering (Department of Electrical Engineering.) http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=63266
collection NDLTD
language en
format Others
sources NDLTD
topic Logic circuits -- Testing.
Integrated circuits -- Very large scale integration -- Testing.
spellingShingle Logic circuits -- Testing.
Integrated circuits -- Very large scale integration -- Testing.
Panda, Uma R.
An efficient single-latch scan-design scheme/
author Panda, Uma R.
author_facet Panda, Uma R.
author_sort Panda, Uma R.
title An efficient single-latch scan-design scheme/
title_short An efficient single-latch scan-design scheme/
title_full An efficient single-latch scan-design scheme/
title_fullStr An efficient single-latch scan-design scheme/
title_full_unstemmed An efficient single-latch scan-design scheme/
title_sort efficient single-latch scan-design scheme/
publisher McGill University
publishDate 1985
url http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=63266
work_keys_str_mv AT pandaumar anefficientsinglelatchscandesignscheme
AT pandaumar efficientsinglelatchscandesignscheme
_version_ 1716644704863387648