High resolution structural investigation of synthetic and natural 2:1 clay-mineral assemblages using advanced sample preparation and electron microscopy imaging techniques
In this study, X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), and conventional TEM (CTEM) of Pt-C replicas are used to characterize both synthetic and natural 2:1 clay minerals from a variety of geological environments. In manuscript 1, reference samples of illite...
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| Format: | Others |
| Language: | en |
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McGill University
2012
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| Online Access: | http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=106372 |