Design and optimization of an AFM probe based on piezoresistance effect
Atomic Force Microscopy (AFM) probes with embedded stress sensors have demonstrated the ability to address key issues such as simplicity, reliability, and responsiveness to parallel scanning techniques and therefore are promising devices for AFM applications. Even though there are some other candida...
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2005
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| Online Access: | http://spectrum.library.concordia.ca/8406/1/MR04377.pdf Hosseini, Mehran <http://spectrum.library.concordia.ca/view/creators/Hosseini=3AMehran=3A=3A.html> (2005) Design and optimization of an AFM probe based on piezoresistance effect. Masters thesis, Concordia University. |