Statistical Yield Analysis and Design for Nanometer VLSI
Process variability is the pivotal factor impacting the design of high yield integrated circuits and systems in deep sub-micron CMOS technologies. The electrical and physical properties of transistors and interconnects, the building blocks of integrated circuits, are prone to significant variations...
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| Language: | en |
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2010
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| Online Access: | http://hdl.handle.net/10012/5361 |
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