| id |
ndltd-LACETR-oai-collectionscanada.gc.ca-MWU.1993-15158
|
| record_format |
oai_dc
|
| spelling |
ndltd-LACETR-oai-collectionscanada.gc.ca-MWU.1993-151582014-03-29T03:46:22Z Electronic properties of grain boundaries in silicon Thomson, Douglas J. 2013-01-18T21:33:56Z 2013-01-18T21:33:56Z 1983 http://hdl.handle.net/1993/15158
|
| collection |
NDLTD
|
| sources |
NDLTD
|
| description |
|
| author |
Thomson, Douglas J.
|
| spellingShingle |
Thomson, Douglas J.
Electronic properties of grain boundaries in silicon
|
| author_facet |
Thomson, Douglas J.
|
| author_sort |
Thomson, Douglas J.
|
| title |
Electronic properties of grain boundaries in silicon
|
| title_short |
Electronic properties of grain boundaries in silicon
|
| title_full |
Electronic properties of grain boundaries in silicon
|
| title_fullStr |
Electronic properties of grain boundaries in silicon
|
| title_full_unstemmed |
Electronic properties of grain boundaries in silicon
|
| title_sort |
electronic properties of grain boundaries in silicon
|
| publishDate |
2013
|
| url |
http://hdl.handle.net/1993/15158
|
| work_keys_str_mv |
AT thomsondouglasj electronicpropertiesofgrainboundariesinsilicon
|
| _version_ |
1716660346713800704
|
