Testing for floating gates defects in CMOS circuits
This thesis studies the detectability of MOS floating gate transistor faults considering classical Static Voltage, Dynamic Voltage and Static Current testing strategies. The behavior of the defect depends on two classes of parameters: the predictable and unpredictable parameters. A floating gate...
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| Language: | English |
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2009
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| Online Access: | http://hdl.handle.net/2429/8227 |
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