Compact models for the high-frequency characteristics of modern bipolar transistors
Modern bipolar transistors are characterized by shrinking dimensions (now on the order of a mean-free path length for carrier scattering), reduced parasitics (particularly in heterojunction devices), and increasing cutoff frequencies (now over 100 GHz). As a result, the classical models used for...
Main Author: | Vaidyanathan, Mani |
---|---|
Language: | English |
Published: |
2009
|
Online Access: | http://hdl.handle.net/2429/10107 |
Similar Items
-
Compact models for the high-frequency characteristics of modern bipolar transistors
by: Vaidyanathan, Mani
Published: (2009) -
High Frequency Noise Characteristics and Modeling of Heterojunction Bipolar Transistors
by: Shou-chien Huang, et al.
Published: (2009) -
Nonlinear bipolar transistor modelling for high frequency amplifiers
by: Redfern, S. W.
Published: (1983) -
The Study on High Frequency Silicon Bipolar Junction Transistor Modeling
by: Yu-Min Deng, et al.
Published: (1999) -
A one-dimensional solution of the Boltzmann transport equation with application to the compact modeling of modern bipolar transistors
by: St.Denis, Anthony Robert
Published: (2009)