Design, construction and proposed use of apparatus for measuring resistivity of thin films in the temperature range 4.2-300K̊

Design, construction and proposed use of apparatus for measuring resistivity of thin films in the temperature range 4.2-300K̊

Digitized by Kansas Correctional Industries

Bibliographic Details
Main Author:	Sethna, Prochy Phiroze
Language:	en_US
Published:	Kansas State University 2011
Online Access:	http://hdl.handle.net/2097/10614

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