Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits

Bibliographic Details
Main Author:	Nalluri, Suresh Babu
Other Authors:	Shiva Prasad, A P
Language:	en_US
Published:	2011
Subjects:	Integrated Circuits - Design and Construction Analog Integrated Circuit Design Statistical MOS Model (SMOS) Response Surface Methodology (RSM) Statistical Simulation Electronic Engineering
Online Access:	http://etd.iisc.ernet.in/handle/2005/1198 http://etd.ncsi.iisc.ernet.in/abstracts/1558/G18903-Abs.pdf

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spelling	ndltd-IISc-oai-etd.ncsi.iisc.ernet.in-2005-11982018-01-10T03:35:47ZStatistical Design For Yield And Variability Optimization Of Analog Integrated CircuitsNalluri, Suresh BabuIntegrated Circuits - Design and ConstructionAnalog Integrated Circuit DesignStatistical MOS Model (SMOS)Response Surface Methodology (RSM)Statistical SimulationElectronic EngineeringShiva Prasad, A P2011-05-13T10:21:22Z2011-05-13T10:21:22Z2011-05-132004-12Thesishttp://etd.iisc.ernet.in/handle/2005/1198http://etd.ncsi.iisc.ernet.in/abstracts/1558/G18903-Abs.pdfen_USG18903
collection	NDLTD
language	en_US
sources	NDLTD
topic	Integrated Circuits - Design and Construction Analog Integrated Circuit Design Statistical MOS Model (SMOS) Response Surface Methodology (RSM) Statistical Simulation Electronic Engineering
spellingShingle	Integrated Circuits - Design and Construction Analog Integrated Circuit Design Statistical MOS Model (SMOS) Response Surface Methodology (RSM) Statistical Simulation Electronic Engineering Nalluri, Suresh Babu Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits
author2	Shiva Prasad, A P
author_facet	Shiva Prasad, A P Nalluri, Suresh Babu
author	Nalluri, Suresh Babu
author_sort	Nalluri, Suresh Babu
title	Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits
title_short	Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits
title_full	Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits
title_fullStr	Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits
title_full_unstemmed	Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits
title_sort	statistical design for yield and variability optimization of analog integrated circuits
publishDate	2011
url	http://etd.iisc.ernet.in/handle/2005/1198 http://etd.ncsi.iisc.ernet.in/abstracts/1558/G18903-Abs.pdf
work_keys_str_mv	AT nallurisureshbabu statisticaldesignforyieldandvariabilityoptimizationofanalogintegratedcircuits
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Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits

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