Solu??o do problema inverso da tomografia por imped?ncia el?trica utilizando o simulated annealing : uma nova abordagem

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Bibliographic Details
Main Author: Martins, Jefferson Santana
Other Authors: Vargas, Rubem Mario Figueiro
Format: Others
Language:Portuguese
Published: Pontif?cia Universidade Cat?lica do Rio Grande do Sul 2016
Subjects:
Online Access:http://tede2.pucrs.br/tede2/handle/tede/6625

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