Monitoração dinâmica de asserções para depuração em silício
=== The increasing demand for shorter time-to-market, combined with increased complexity and performance requirements put a tremendous pressure on post-silicon debug, which is usually the last step prior to chip release. In contrast to pre-silicon techniques, postsilicon debug have two main limitat...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | English |
| Published: |
Universidade Federal de Minas Gerais
2011
|
| Online Access: | http://hdl.handle.net/1843/SLSS-8KKR3X |