Espalhamento ressonante de Raios-X aplicado ao estudo de nano-estruturas
=== In this thesis, resonant X-ray scattering techniques were used to study two different systems. First, grazing incidence difraction associated with dispersion corrections in the atomic scattering factor were employed to probe the chemical concentration profile in self-assembled islands of InP ep...
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| Format: | Others |
| Language: | Portuguese |
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Universidade Federal de Minas Gerais
2008
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| Online Access: | http://hdl.handle.net/1843/ESCZ-7N4HHY |