Modeling and Measurements of the Bidirectional Reflectance of Microrough Silicon Surfaces
Bidirectional reflectance is a fundamental radiative property of rough surfaces. Knowledge of the bidirectional reflectance is crucial to the emissivity modeling and heat transfer analysis. This thesis concentrates on the modeling and measurements of the bidirectional reflectance for microrough sili...
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| Format: | Others |
| Language: | en_US |
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Georgia Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1853/5062 |