Modeling time-resolved interaction force mode AFM imaging
Intermittent contact mode atomic force microscopy has been widely employed for simultaneous topography imaging and material characterization. The work in the literature includes both qualitative and quantitative methods. Regular AFM cantilevers are generally used in these methods, yet these cantilev...
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Georgia Institute of Technology
2012
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| Online Access: | http://hdl.handle.net/1853/43691 |