Adhesion of nano-objects to chemically modified surfaces
The Atomic Force Microscope (AFM) is an instrument that is capable of measuring intermolecular forces between single molecules. Multi-Parameter Force Spectroscopy (MPFS) is a technique that uses the AFM. MPFS enables the acquisition of force curves and thermal resonance of the system under investi...
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Georgia Institute of Technology
2010
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| Online Access: | http://hdl.handle.net/1853/31837 |