Correlation of defects and electrical properties in Si and ZnO

Correlation of defects and electrical properties in Si and ZnO

Bibliographic Details
Main Author: Ramanachalam, M. Swaminathan
Published: Georgia Institute of Technology 2008
Subjects:
Silicon
Silicon crystals Electrical properties
Online Access:http://hdl.handle.net/1853/19675

Internet

http://hdl.handle.net/1853/19675

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