Signature based testing of analog and RF circuits
Main Author: | Voorakaranam, Ramakrishna |
---|---|
Published: |
Georgia Institute of Technology
2007
|
Subjects: | |
Online Access: | http://hdl.handle.net/1853/15009 |
Similar Items
-
System-level design and RF front-end implementation for a 3-10ghz multiband-ofdm ultrawideband receiver and built-in testing techniques for analog and rf integrated circuits
by: Valdes Garcia, Alberto
Published: (2007) -
Efficient testing techniques for analog and mixed-signal circuits
by: Variyam, Pramodchandran
Published: (2007) -
Statistical prediction of integrated circuit performance based on circuit design and test structure evaluation
by: Gibson, David
Published: (2007) -
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits
by: Josep Altet, et al.
Published: (2021-01-01) -
Parametric testing, characterization and reliability of integrated circuits
by: Datta, Ramyanshu
Published: (2008)