Efficient Production Testing of High-Performance RF Modules and Systems using Low-Cost ATE
The proliferation of wireless communication devices in the recent past has increased the pressure on semiconductor manufacturers to produce quality radio frequency (RF) modules and systems at a low cost. This entails reducing their test cost as well, since the cost of testing modern RF devices can b...
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| Format: | Others |
| Language: | en_US |
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Georgia Institute of Technology
2007
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| Online Access: | http://hdl.handle.net/1853/14113 |