A method of determining the high frequency dielectric properties of thin films using in-situ structures

A method of determining the high frequency dielectric properties of thin films using in-situ structures

Bibliographic Details
Main Author: Laursen, Kirk Garrett
Format: Others
Language:en_US
Published: Georgia Institute of Technology 2007
Subjects:
Dielectrics
Electronic circuits
Thin films
Online Access:http://hdl.handle.net/1853/13844
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spelling ndltd-GATECH-oai-smartech.gatech.edu-1853-138442013-12-15T03:33:50ZA method of determining the high frequency dielectric properties of thin films using in-situ structuresLaursen, Kirk GarrettDielectricsElectronic circuitsThin filmsGeorgia Institute of Technology2007-03-27T13:28:07Z2007-03-27T13:28:07Z1997-05Dissertation239 bytestext/htmlhttp://hdl.handle.net/1853/13844444390en_USAccess restricted to authorized Georgia Tech users only.
collection NDLTD
language en_US
format Others
sources NDLTD
topic Dielectrics
Electronic circuits
Thin films
spellingShingle Dielectrics
Electronic circuits
Thin films
Laursen, Kirk Garrett
A method of determining the high frequency dielectric properties of thin films using in-situ structures
author Laursen, Kirk Garrett
author_facet Laursen, Kirk Garrett
author_sort Laursen, Kirk Garrett
title A method of determining the high frequency dielectric properties of thin films using in-situ structures
title_short A method of determining the high frequency dielectric properties of thin films using in-situ structures
title_full A method of determining the high frequency dielectric properties of thin films using in-situ structures
title_fullStr A method of determining the high frequency dielectric properties of thin films using in-situ structures
title_full_unstemmed A method of determining the high frequency dielectric properties of thin films using in-situ structures
title_sort method of determining the high frequency dielectric properties of thin films using in-situ structures
publisher Georgia Institute of Technology
publishDate 2007
url http://hdl.handle.net/1853/13844
work_keys_str_mv AT laursenkirkgarrett amethodofdeterminingthehighfrequencydielectricpropertiesofthinfilmsusinginsitustructures
AT laursenkirkgarrett methodofdeterminingthehighfrequencydielectricpropertiesofthinfilmsusinginsitustructures
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