A study of relative K x-ray intensities and of high Z K-fluorescence yields

Bibliographic Details
Main Author: Hansen, John Steven
Format: Others
Language:en_US
Published: Georgia Institute of Technology 2007
Subjects:
Online Access:http://hdl.handle.net/1853/13442
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spelling ndltd-GATECH-oai-smartech.gatech.edu-1853-134422013-12-15T03:33:43ZA study of relative K x-ray intensities and of high Z K-fluorescence yieldsHansen, John StevenX-raysAuger effectGeorgia Institute of Technology2007-02-09T20:59:12Z2007-02-09T20:59:12Z1971-05Dissertation238 bytestext/htmlhttp://hdl.handle.net/1853/13442259242en_USAccess restricted to authorized Georgia Tech users only.
collection NDLTD
language en_US
format Others
sources NDLTD
topic X-rays
Auger effect
spellingShingle X-rays
Auger effect
Hansen, John Steven
A study of relative K x-ray intensities and of high Z K-fluorescence yields
author Hansen, John Steven
author_facet Hansen, John Steven
author_sort Hansen, John Steven
title A study of relative K x-ray intensities and of high Z K-fluorescence yields
title_short A study of relative K x-ray intensities and of high Z K-fluorescence yields
title_full A study of relative K x-ray intensities and of high Z K-fluorescence yields
title_fullStr A study of relative K x-ray intensities and of high Z K-fluorescence yields
title_full_unstemmed A study of relative K x-ray intensities and of high Z K-fluorescence yields
title_sort study of relative k x-ray intensities and of high z k-fluorescence yields
publisher Georgia Institute of Technology
publishDate 2007
url http://hdl.handle.net/1853/13442
work_keys_str_mv AT hansenjohnsteven astudyofrelativekxrayintensitiesandofhighzkfluorescenceyields
AT hansenjohnsteven studyofrelativekxrayintensitiesandofhighzkfluorescenceyields
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