Test support processor for enhanced testability of high performance integrated circuits

Bibliographic Details
Main Author:	Zhou, Qing
Format:	Others
Language:	en_US
Published:	Georgia Institute of Technology 2006
Subjects:	Integrated circuits Testing
Online Access:	http://hdl.handle.net/1853/13010

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spelling	ndltd-GATECH-oai-smartech.gatech.edu-1853-130102013-12-15T03:33:24ZTest support processor for enhanced testability of high performance integrated circuitsZhou, QingIntegrated circuits TestingGeorgia Institute of Technology2006-12-21T15:09:30Z2006-12-21T15:09:30Z2001-08Dissertation234 bytestext/htmlhttp://hdl.handle.net/1853/13010610910en_USAccess restricted to authorized Georgia Tech users only.
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
topic	Integrated circuits Testing
spellingShingle	Integrated circuits Testing Zhou, Qing Test support processor for enhanced testability of high performance integrated circuits
author	Zhou, Qing
author_facet	Zhou, Qing
author_sort	Zhou, Qing
title	Test support processor for enhanced testability of high performance integrated circuits
title_short	Test support processor for enhanced testability of high performance integrated circuits
title_full	Test support processor for enhanced testability of high performance integrated circuits
title_fullStr	Test support processor for enhanced testability of high performance integrated circuits
title_full_unstemmed	Test support processor for enhanced testability of high performance integrated circuits
title_sort	test support processor for enhanced testability of high performance integrated circuits
publisher	Georgia Institute of Technology
publishDate	2006
url	http://hdl.handle.net/1853/13010
work_keys_str_mv	AT zhouqing testsupportprocessorforenhancedtestabilityofhighperformanceintegratedcircuits
_version_	1716617593789349888

Test support processor for enhanced testability of high performance integrated circuits

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