SIMD-Swift: Improving Performance of Swift Fault Detection

The general tendency in modern hardware is an increase in fault rates, which is caused by the decreased operation voltages and feature sizes. Previously, the issue of hardware faults was mainly approached only in high-availability enterprise servers and in safety-critical applications, such as trans...

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Bibliographic Details
Main Author: Oleksenko, Oleksii
Other Authors: Fetzer, Christof
Format: Dissertation
Language:English
Published: 2016
Subjects:
Online Access:http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-192523
https://tud.qucosa.de/id/qucosa%3A29158
https://tud.qucosa.de/api/qucosa%3A29158/attachment/ATT-1/