SIMD-Swift: Improving Performance of Swift Fault Detection
The general tendency in modern hardware is an increase in fault rates, which is caused by the decreased operation voltages and feature sizes. Previously, the issue of hardware faults was mainly approached only in high-availability enterprise servers and in safety-critical applications, such as trans...
Main Author: | Oleksenko, Oleksii |
---|---|
Other Authors: | Fetzer, Christof |
Format: | Dissertation |
Language: | English |
Published: |
2016
|
Subjects: | |
Online Access: | http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-192523 https://tud.qucosa.de/id/qucosa%3A29158 https://tud.qucosa.de/api/qucosa%3A29158/attachment/ATT-1/ |
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