Herstellung und Charakterisierung amorpher Al-Cr-Schichten

Herstellung und Charakterisierung amorpher Al-Cr-Schichten

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Thin amorphous films of binary aluminum-chromium alloys have been produced by flash evaporation and characterized by means of electron diffraction and measurements of transport properties. Beside the known effect of hybridization on the phase stability an additional structure forming mechanism could...

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Bibliographic Details
Main Author: Stiehler, Martin
Other Authors: Häussler, Peter
Format: Dissertation
Language:German
Published: 2005
Subjects:
info:eu-repo/classification/ddc/530
ddc:530
Aluminiumlegierung
Elektronendiffraktometrie
Elektronischer Transport
Hume-Rothery-Phase
Kristallisation
Metallisches Glas / Dünne Schicht
Plasmon
Tieftemperaturphysik
Amorpher Festkörper
Chromlegierung
Dünne Schicht
Elektrische Leitfähigkeit
Elektronegativität
Elektronen-Energieverlustspektroskopie
Elektronendichte
Elektronendichtebestimmung
Al-TM-Legierungen
Hybridisierung
Phasenstabilität
Pseudogap
Winkelkorrelationen
Online Access:http://nbn-resolving.de/urn:nbn:de:swb:ch1-200500018
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