Chemical and Mineralogical Characterization of Micro-Inclusions in Diamonds
<p>Secondary-ion mass spectrometry (SIMS), electron probe analysis (EPMA), analytical scanning electron microscopy (SEM) and infrared (IR) spectroscopy were used to determine the chemical composition and the mineralogy of sub-micrometer inclusions in cubic diamonds and in overgrowths (coats) o...
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| Format: | Others |
| Language: | en |
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1989
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| Online Access: | https://thesis.library.caltech.edu/8006/2/Navon_o_1989.pdf Navon, Oded (1989) Chemical and Mineralogical Characterization of Micro-Inclusions in Diamonds. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/A88J-S465. https://resolver.caltech.edu/CaltechTHESIS:10232013-113130725 <https://resolver.caltech.edu/CaltechTHESIS:10232013-113130725> |
Internet
https://thesis.library.caltech.edu/8006/2/Navon_o_1989.pdfNavon, Oded (1989) Chemical and Mineralogical Characterization of Micro-Inclusions in Diamonds. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/A88J-S465. https://resolver.caltech.edu/CaltechTHESIS:10232013-113130725 <https://resolver.caltech.edu/CaltechTHESIS:10232013-113130725>