Scanning probe chemical and topographical microanalysis

The last decade has seen a rapid rise of Scanning Probe Microscopy, SPM, as a prominent and versatile approach for surface studies. SPM instruments are differentiated from the beam-based ones by the fact that they use solid proximal probes for localized analysis. The most commonly used SPM methodolo...

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Bibliographic Details
Main Author: Kossakovski, Dmitri A.
Format: Others
Language:en
Published: 2000
Online Access:https://thesis.library.caltech.edu/792/1/Kossakovski_da_2000.pdf
Kossakovski, Dmitri A. (2000) Scanning probe chemical and topographical microanalysis. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/at5p-pe62. https://resolver.caltech.edu/CaltechETD:etd-02272009-085501 <https://resolver.caltech.edu/CaltechETD:etd-02272009-085501>

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