A fault tolerant integrated circuit memory
<p>Most commercially produced integrated circuits are incapable of tolerating manufacturing defects. The area and function of the circuits is thus limited by the probability of faults occurring within the circuit. This thesis examines techniques for using redundancy in memory circuits to p...
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| Format: | Others |
| Language: | en |
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1980
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| Online Access: | https://thesis.library.caltech.edu/6861/2/Barton_af_1980.pdf Barton, Anthony Francis (1980) A fault tolerant integrated circuit memory. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/dr7k-qn11. https://resolver.caltech.edu/CaltechTHESIS:03212012-110600634 <https://resolver.caltech.edu/CaltechTHESIS:03212012-110600634> |
Internet
https://thesis.library.caltech.edu/6861/2/Barton_af_1980.pdfBarton, Anthony Francis (1980) A fault tolerant integrated circuit memory. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/dr7k-qn11. https://resolver.caltech.edu/CaltechTHESIS:03212012-110600634 <https://resolver.caltech.edu/CaltechTHESIS:03212012-110600634>