The evaluation of E-k curves from tunneling currents

The basis for interpreting I-V data taken on metal-insulator-metal structures with insulator thicknesses of less than 100 Å is examined carefully. A set of experimental tests for determining the applicability of the equation linking the I-V data to the E-k curve is presented. These tests are found t...

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Bibliographic Details
Main Author: McGill, T. C.
Format: Others
Published: 1969
Online Access:https://thesis.library.caltech.edu/4966/1/McGill_tc_1969.pdf
McGill, T. C. (1969) The evaluation of E-k curves from tunneling currents. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/D3BX-RQ47. https://resolver.caltech.edu/CaltechETD:etd-12122006-092025 <https://resolver.caltech.edu/CaltechETD:etd-12122006-092025>

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