The evaluation of E-k curves from tunneling currents

• Main Author: McGill, T. C.
• Format: Others
• Published: 1969
• Online Access: https://thesis.library.caltech.edu/4966/1/McGill_tc_1969.pdf; McGill, T. C. (1969) The evaluation of E-k curves from tunneling currents. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/D3BX-RQ47. https://resolver.caltech.edu/CaltechETD:etd-12122006-092025 <https://resolver.caltech.edu/CaltechETD:etd-12122006-092025>

The basis for interpreting I-V data taken on metal-insulator-metal structures with insulator thicknesses of less than 100 Å is examined carefully. A set of experimental tests for determining the applicability of the equation linking the I-V data to the E-k curve is presented. These tests are found to be a stringent requirement on the experimental data and to support strongly the interpretation of the experimental I-V in terms of the E-k curve for the insulator. A numerical technique for obtaining the E-k curve from I-V data is presented, and applied to data taken on Al-AlN-(Mg,Au) structures where it allows the evaluation of the E-k curve for AlN throughout the forbidden gap.