Deep Levels and High Concentrations of Impurities in Silicon
<p>A study of the electronic levels associated with the divacancy in silicon is reported. The extended Hückel theory is shown to reproduce the band structure of silicon near the energy gap. The electronic levels of the divacancy are calculated by considering a periodic array of large unit ce...
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| Format: | Others |
| Language: | en |
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1975
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| Online Access: | https://thesis.library.caltech.edu/14392/1/Lee_T-WF_1975.pdf Lee, Tsu-wei Frank (1975) Deep Levels and High Concentrations of Impurities in Silicon. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/j2rb-3s97. https://resolver.caltech.edu/CaltechTHESIS:10122021-201307143 <https://resolver.caltech.edu/CaltechTHESIS:10122021-201307143> |
Internet
https://thesis.library.caltech.edu/14392/1/Lee_T-WF_1975.pdfLee, Tsu-wei Frank (1975) Deep Levels and High Concentrations of Impurities in Silicon. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/j2rb-3s97. https://resolver.caltech.edu/CaltechTHESIS:10122021-201307143 <https://resolver.caltech.edu/CaltechTHESIS:10122021-201307143>