A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts
<p>The apparatus used in the experiment is described in detail and the calibration of the instruments is discussed. The procedure followed in the experiment is described. Experimental results are presented in the form of curves and the analysis of the curves is given in detail. The final...
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ndltd-CALTECH-oai-thesis.library.caltech.edu-105232019-12-22T03:10:14Z A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts Felt, Gaelen Lee <p>The apparatus used in the experiment is described in detail and the calibration of the instruments is discussed. The procedure followed in the experiment is described. Experimental results are presented in the form of curves and the analysis of the curves is given in detail. The final value of the ratio h/e obtained in this experiment is</p> <p>h/e = 1.37912 ± 0.00007 x 10<sup>-17</sup>erg-sec/esu</p> 1951 Thesis NonPeerReviewed application/pdf https://thesis.library.caltech.edu/10523/1/Felt_GL_1951.pdf https://resolver.caltech.edu/CaltechTHESIS:10172017-084702172 Felt, Gaelen Lee (1951) A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/H0QJ-YJ54. https://resolver.caltech.edu/CaltechTHESIS:10172017-084702172 <https://resolver.caltech.edu/CaltechTHESIS:10172017-084702172> https://thesis.library.caltech.edu/10523/ |
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description |
<p>The apparatus used in the experiment is described in detail
and the calibration of the instruments is discussed.
The procedure followed in the experiment is described.
Experimental results are presented in the form of curves and the
analysis of the curves is given in detail. The final value of
the ratio h/e obtained in this experiment is</p>
<p>h/e = 1.37912 ± 0.00007 x 10<sup>-17</sup>erg-sec/esu</p> |
author |
Felt, Gaelen Lee |
spellingShingle |
Felt, Gaelen Lee A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts |
author_facet |
Felt, Gaelen Lee |
author_sort |
Felt, Gaelen Lee |
title |
A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts |
title_short |
A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts |
title_full |
A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts |
title_fullStr |
A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts |
title_full_unstemmed |
A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts |
title_sort |
measurement of the value of h/e by the determination of the short wavelength limit of the continuous x-ray spectrum at 25 kilovolts |
publishDate |
1951 |
url |
https://thesis.library.caltech.edu/10523/1/Felt_GL_1951.pdf Felt, Gaelen Lee (1951) A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/H0QJ-YJ54. https://resolver.caltech.edu/CaltechTHESIS:10172017-084702172 <https://resolver.caltech.edu/CaltechTHESIS:10172017-084702172> |
work_keys_str_mv |
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1719305386160291840 |