Mechanically Scanned Interference Pattern Structured Illumination Imaging
A method of lensless, single pixel imaging is presented. This method, referred to as MAS-IPSII, is theoretically capable of resolutions as small as one quarter of the wavelength of the imaging light. The resolution is not limited by the aperture of any optic, making high resolutions (including subwa...
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2019
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ndltd-BGMYU2-oai-scholarsarchive.byu.edu-etd-84832019-09-04T03:01:26Z Mechanically Scanned Interference Pattern Structured Illumination Imaging Jackson, Jarom Silver A method of lensless, single pixel imaging is presented. This method, referred to as MAS-IPSII, is theoretically capable of resolutions as small as one quarter of the wavelength of the imaging light. The resolution is not limited by the aperture of any optic, making high resolutions (including subwavelength) feasible even at very large (greater than a meter) distances. Imaging requires only flat optics and a coherent source, making it a good candidate for imaging with extreme wavelengths in the UV and x-ray regimes. The method is demonstrated by the imaging of various test targets. Both real and complex imaging (i.e. holography) is demonstrated. 2019-06-01T07:00:00Z text application/pdf https://scholarsarchive.byu.edu/etd/7483 https://scholarsarchive.byu.edu/cgi/viewcontent.cgi?article=8483&context=etd http://lib.byu.edu/about/copyright/ Theses and Dissertations BYU ScholarsArchive synthetic aperture structured illumination SAM SIM IPSII microscopy complex imaging |
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Others
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synthetic aperture structured illumination SAM SIM IPSII microscopy complex imaging |
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synthetic aperture structured illumination SAM SIM IPSII microscopy complex imaging Jackson, Jarom Silver Mechanically Scanned Interference Pattern Structured Illumination Imaging |
| description |
A method of lensless, single pixel imaging is presented. This method, referred to as MAS-IPSII, is theoretically capable of resolutions as small as one quarter of the wavelength of the imaging light. The resolution is not limited by the aperture of any optic, making high resolutions (including subwavelength) feasible even at very large (greater than a meter) distances. Imaging requires only flat optics and a coherent source, making it a good candidate for imaging with extreme wavelengths in the UV and x-ray regimes. The method is demonstrated by the imaging of various test targets. Both real and complex imaging (i.e. holography) is demonstrated. |
| author |
Jackson, Jarom Silver |
| author_facet |
Jackson, Jarom Silver |
| author_sort |
Jackson, Jarom Silver |
| title |
Mechanically Scanned Interference Pattern Structured Illumination Imaging |
| title_short |
Mechanically Scanned Interference Pattern Structured Illumination Imaging |
| title_full |
Mechanically Scanned Interference Pattern Structured Illumination Imaging |
| title_fullStr |
Mechanically Scanned Interference Pattern Structured Illumination Imaging |
| title_full_unstemmed |
Mechanically Scanned Interference Pattern Structured Illumination Imaging |
| title_sort |
mechanically scanned interference pattern structured illumination imaging |
| publisher |
BYU ScholarsArchive |
| publishDate |
2019 |
| url |
https://scholarsarchive.byu.edu/etd/7483 https://scholarsarchive.byu.edu/cgi/viewcontent.cgi?article=8483&context=etd |
| work_keys_str_mv |
AT jacksonjaromsilver mechanicallyscannedinterferencepatternstructuredilluminationimaging |
| _version_ |
1719242809545850880 |