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01559 am a22002173u 4500 |
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|a Liu, Frank
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|a Massachusetts Institute of Technology. Department of Materials Science and Engineering
|e contributor
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|a Liu, Frank
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|a Ross, Caroline A.
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|a Ross, Caroline A.
|e author
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|a Magnetization Reversal in Ferromagnetic Films Patterned with Antiferromagnetic Gratings of Various Sizes
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|b American Physical Society,
|c 2015-11-23T14:23:47Z.
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|z Get fulltext
|u http://hdl.handle.net/1721.1/99982
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|a The magnetic switching behavior in continuous NiFe films patterned with IrMn gratings is investigated experimentally and with micromagnetic simulations. The samples made by a two-step deposition process consist of a 10-nm-thick NiFe layer on which is placed 10-nm-thick IrMn stripes with width from 100 to 500 nm and period from 240 nm to 1 μm. Exchange bias is introduced by field cooling in directions parallel or perpendicular to the IrMn stripes. The samples display a two-step hysteresis loop for higher stripe width and period, as the pinned and unpinned regions of the NiFe reverse independently but a one-step loop for lower stripe periods. The transition between these regimes is reproduced by micromagnetic modeling.
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|a National Science Foundation (U.S.)
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|a Semiconductor Research Corporation. Interconnect Focus Center
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|a en
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|a Article
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|t Physical Review Applied
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