Electron Pulse Compression with a Practical Reflectron Design for Ultrafast Electron Diffraction

Ultrafast electron diffraction (UED) is a powerful method for studying time-resolved structural changes. Currently, space-charge-induced temporal broadening prevents obtaining high-brightness electron pulses with sub-100 fs durations limiting the range of phenomena that can be studied with this tech...

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Bibliographic Details
Main Authors: Wang, Yihua (Author), Gedik, Nuh (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Physics (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers, 2013-04-10T14:08:16Z.
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Online Access:Get fulltext
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100 1 0 |a Wang, Yihua  |e author 
100 1 0 |a Massachusetts Institute of Technology. Department of Physics  |e contributor 
100 1 0 |a Gedik, Nuh  |e contributor 
100 1 0 |a Gedik, Nuh  |e contributor 
700 1 0 |a Gedik, Nuh  |e author 
245 0 0 |a Electron Pulse Compression with a Practical Reflectron Design for Ultrafast Electron Diffraction 
260 |b Institute of Electrical and Electronics Engineers,   |c 2013-04-10T14:08:16Z. 
856 |z Get fulltext  |u http://hdl.handle.net/1721.1/78316 
520 |a Ultrafast electron diffraction (UED) is a powerful method for studying time-resolved structural changes. Currently, space-charge-induced temporal broadening prevents obtaining high-brightness electron pulses with sub-100 fs durations limiting the range of phenomena that can be studied with this technique. We review the state of the art of UED in this respect and propose a practical design for reflectron-based pulse compression that utilizes only electrostatic optics and has a tunable temporal focal point. Our simulation shows that this scheme is capable of compressing an electron pulse containing 100 000 electrons with 60:1 temporal compression ratio. 
520 |a United States. Dept. of Energy (Award DE-FG02-08ER46521) 
520 |a National Science Foundation (U.S.) (Materials Research Science and Engineering Center (MRSEC) Program, Award DMR-0819762) 
546 |a en_US 
655 7 |a Article 
773 |t IEEE Journal of Selected Topics in Quantum Electronics